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X-ray microtomography: Characterisation of structures and defect analysis
Bernhard Harrer
,
Johann Kastner
R&D-Headquarters
Research Center Wels
Research output
:
Chapter in Book/Report/Conference proceedings
›
Chapter
›
peer-review
4
Citations (Scopus)
Overview
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Dive into the research topics of 'X-ray microtomography: Characterisation of structures and defect analysis'. Together they form a unique fingerprint.
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Keyphrases
Microfocus
100%
Structure Characterization
100%
Defect Analysis
100%
Structure Analysis
100%
X-ray Microtomography
100%
Tomography, X-ray Computed
100%
Three-dimensional (3D)
66%
Spatial Resolution
66%
Panel Matrix
33%
Tomographic Technique
33%
Material Volume
33%
Size Scaling
33%
Flat Panel
33%
Matrix Detector
33%
Volume Fraction
33%
Cone-beam X-ray
33%
Voxel Size
33%
Microstructural Characteristics
33%
Composite Materials
33%
Material System
33%
Structural Information
33%
Light Elements
33%
Hidden Structure
33%
Polymeric Materials
33%
Fe-based Materials
33%
Quality Control
33%
Dendritic Structure
33%
Foam Matrix
33%
Cast Iron
33%
Suitable Assessment
33%
Metal Fe
33%
X-ray Tube
33%
Minimum Volume
33%
Metallic Foam
33%
Material Quality
33%
Contrast Resolution
33%
Metal Matrix Composites
33%
Inner Structure
33%
Metallographic Techniques
33%
Three-dimensional Distribution
33%
Chief Concern
33%
Quantitative Description
33%
Material Science
X-Ray Microtomography
100%
X-Ray Computed Tomography
100%
Composite Material
33%
Volume Fraction
33%
Polymer
33%
Metal Matrix Composite
33%
Light Metal
33%
Quality Control
33%