TALINT grating kits for X-ray interferometry in the industrial laboratory

Aishwarya Nafre, Jonathan Glinz, Joachim Schulz, Sascha Senck

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

1 results

Finished
Phad-CT - Quantitative phase and dark-field contrast computed tomography for industrial applications on lightweight materials
Senck, S. (PI) & Glinz, J. (CoI)
Dissertationsprogramm der Fachhochschule OÖ
01.12.2019 → 30.11.2022
Project: Research Project