TALINT grating kits for X-ray interferometry in the industrial laboratory

Aishwarya Nafre, Jonathan Glinz, Joachim Schulz, Sascha Senck

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

Original language	German (Austria)
Title of host publication	11th Conference on Industrial Computed Tomography
Pages	1-9
Number of pages	9
Publication status	Published - 8 Feb 2022

Cite this

@inproceedings{a818d25327ee48c4a6df22abb3a8a771,

title = "TALINT grating kits for X-ray interferometry in the industrial laboratory",

author = "Aishwarya Nafre and Jonathan Glinz and Joachim Schulz and Sascha Senck",

year = "2022",

month = feb,

day = "8",

language = "Deutsch ({\"O}sterreich)",

pages = "1--9",

booktitle = "11th Conference on Industrial Computed Tomography",

}