Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast

Johann Kastner, Christian Gusenbauer, Sascha Senck, Guruprasad Rao

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

Original language	English
Title of host publication	APCNDT
Publication status	Published - 2017
Event	15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017) - Singapur, Singapore Duration: 13 Nov 2017 → 17 Nov 2017

Conference	15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017)
Country/Territory	Singapore
City	Singapur
Period	13.11.2017 → 17.11.2017

Cite this

@inproceedings{6f1d6fa9ce694e3ba08c9a84f42687b8,

title = "Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast",

author = "Johann Kastner and Christian Gusenbauer and Sascha Senck and Guruprasad Rao",

year = "2017",

language = "English",

booktitle = "APCNDT",

note = "15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017) ; Conference date: 13-11-2017 Through 17-11-2017",

}

TY - GEN

T1 - Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast

AU - Kastner, Johann

AU - Gusenbauer, Christian

AU - Senck, Sascha

AU - Rao, Guruprasad

PY - 2017

Y1 - 2017

M3 - Conference contribution

BT - APCNDT

T2 - 15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017)

Y2 - 13 November 2017 through 17 November 2017

ER -