Strain characterization of Hg1-xFexSe-layers by electron spin resonance

G. Hendorfer*, W. Jantsch, W. Helzel, J. H. Li, Z. Wilamowski, T. Widmer, D. Schikora, K. Lischka

*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Strain characterization of Hg1-xFexSe-layers by electron spin resonance'. Together they form a unique fingerprint.

Engineering

Keyphrases

Material Science

Physics

Biochemistry, Genetics and Molecular Biology