Statistical analysis of multi-material components using dual energy CT

Christoph Heinzl, Johann Kastner, Torsten Möller, Eduard Gröller

Research output: Chapter in Book/Report/Conference proceedingsConference contributionpeer-review

9 Citations (Scopus)

Abstract

This work describes a novel method for statistical analysis of multi-material components. The application scenario is industrial 3D X-ray computed tomography, emphasizing metrology of artefact affected plastics-metal components. The presented work makes use of dual energy CT data acquisition for artefact reduction, in order to optimize CT scans of multi-material components. Using statistical analysis, information on uncertainty is introduced, which allows detailed characterizations of single materials as well as material interfaces. The major contribution of this paper is the development of a specific pipeline based on the dual exposure technique of dual energy CT. After prefiltering and multi-scan fusion, the statistical analysis step computes probability volumes of the fused data using a local histogram analysis technique. The application areas as well as the achieved precision of the presented method are depicted using a test specimen and a real world component.

Original languageEnglish
Title of host publication13th International Fall Workshop Vision, Modeling, and Visualization 2008, VMV 2008
Pages179-188
Number of pages10
Publication statusPublished - 2008
Event13th International Fall Workshop Vision, Modeling, and Visualization 2008, VMV 2008 - Konstanz, Germany
Duration: 8 Oct 200810 Oct 2008

Publication series

Name13th International Fall Workshop Vision, Modeling, and Visualization 2008, VMV 2008

Conference

Conference13th International Fall Workshop Vision, Modeling, and Visualization 2008, VMV 2008
Country/TerritoryGermany
CityKonstanz
Period08.10.200810.10.2008

Keywords

  • Dual Energy CT
  • Partial Range Histograms
  • Bayesian Classification
  • Uncertainty
  • Metrology

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