Simulation of an industrial X-ray cone beam computed-tomography system

Michael Reiter, Daniel Weiss, Hubert Lettenbauer, Johann Kastner

Research output: Chapter in Book/Report/Conference proceedingsConference contribution

Original languageEnglish
Title of host publicationProceedings of IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms
Publication statusPublished - 2008
EventIEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms - Dresden, Germany
Duration: 22 Oct 200824 Oct 2008
http://www.nssmic-xray2008.com/

Workshop

WorkshopIEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms
CountryGermany
CityDresden
Period22.10.200824.10.2008
Internet address

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