Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Michael Reiter; Bernhard Harrer; Dietmar Salaberger; Christoph Heinzl; Christian Gusenbauer; Christoph Kuhn; Johann Kastner

Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Translated title of the contribution: Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Michael Reiter, Bernhard Harrer, Dietmar Salaberger, Christoph Heinzl, Christian Gusenbauer, Christoph Kuhn, Johann Kastner

Research output: Contribution to conference › Poster

Translated title of the contribution	Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation
Original language	German
Publication status	Published - 2011
Event	International Symposium on Digital Industrial Radiology and Computed Tomography 2011 - Berlin, Germany Duration: 20 Jun 2011 → 22 Jun 2011 http://www.dir2011.com

Conference

Conference	International Symposium on Digital Industrial Radiology and Computed Tomography 2011
Country/Territory	Germany
City	Berlin
Period	20.06.2011 → 22.06.2011
Internet address	http://www.dir2011.com

Cite this

Reiter, M., Harrer, B., Salaberger, D., Heinzl, C., Gusenbauer, C., Kuhn, C., & Kastner, J. (2011). Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation. Poster session presented at International Symposium on Digital Industrial Radiology and Computed Tomography 2011, Berlin, Germany.

@conference{49fead310fdd42e5beea710e450bc9fd,

title = "Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation",

author = "Michael Reiter and Bernhard Harrer and Dietmar Salaberger and Christoph Heinzl and Christian Gusenbauer and Christoph Kuhn and Johann Kastner",

year = "2011",

language = "Deutsch",

note = "International Symposium on Digital Industrial Radiology and Computed Tomography 2011 ; Conference date: 20-06-2011 Through 22-06-2011",

url = "http://www.dir2011.com",

}

Reiter, M, Harrer, B, Salaberger, D, Heinzl, C, Gusenbauer, C, Kuhn, C & Kastner, J 2011, 'Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation', International Symposium on Digital Industrial Radiology and Computed Tomography 2011, Berlin, Germany, 20.06.2011 - 22.06.2011.

Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation. / Reiter, Michael; Harrer, Bernhard; Salaberger, Dietmar et al.
2011. Poster session presented at International Symposium on Digital Industrial Radiology and Computed Tomography 2011, Berlin, Germany.

Research output: Contribution to conference › Poster

TY - CONF

T1 - Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

AU - Reiter, Michael

AU - Harrer, Bernhard

AU - Salaberger, Dietmar

AU - Heinzl, Christoph

AU - Gusenbauer, Christian

AU - Kuhn, Christoph

AU - Kastner, Johann

PY - 2011

Y1 - 2011

UR - https://www.ndt.net/article/dir2011/papers/p5.pdf

M3 - Poster

T2 - International Symposium on Digital Industrial Radiology and Computed Tomography 2011

Y2 - 20 June 2011 through 22 June 2011

ER -

Reiter M, Harrer B, Salaberger D, Heinzl C, Gusenbauer C, Kuhn C et al.. Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation. 2011. Poster session presented at International Symposium on Digital Industrial Radiology and Computed Tomography 2011, Berlin, Germany.

Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Conference

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