Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Michael Reiter, Bernhard Harrer, Dietmar Salaberger, Christoph Heinzl, Christian Gusenbauer, Christoph Kuhn, Johann Kastner

Research output: Contribution to conferencePoster

Translated title of the contributionSimulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation
Original languageGerman
Publication statusPublished - 2011
EventInternational Symposium on Digital Industrial Radiology and Computed Tomography 2011 - Berlin, Germany
Duration: 20 Jun 201122 Jun 2011
http://www.dir2011.com

Conference

ConferenceInternational Symposium on Digital Industrial Radiology and Computed Tomography 2011
CountryGermany
CityBerlin
Period20.06.201122.06.2011
Internet address

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