In an almost inexhaustible multitude of possibilities, CT allows to inspect highly complex systems and materials. Compared to other testing techniques CT provides results in a quick way: It is nondestructive and does not interfere with the specimen, it allows non-touching characterizations and what is most important CT allows to characterize hidden or internal features. However, CT would not have reached its current status in engineering without the achievements and possibilities in data processing. Only through processing, analysis and visualization of CT data, detailed insights into previously unachievable analyses are facilitated. Novel means of data analysis and visualization illustrate highly complex problems by means of clear and easy to understand renderings. In this chapter, we explore various aspects starting from the generalized data analysis pipeline, aspects of processing, analysis and visualization for metrology, nondestructive testing as well as specialized analyses.
|Title of host publication||Industrial X-Ray Computed Tomography|
|Publisher||Springer International Publishing AG|
|Number of pages||44|
|Publication status||Published - 1 Jan 2017|
- Visual Computing
- Visual Analysis