Processing, analysis and visualization of CT data

Christoph Heinzl, Aleksandr Amirkhanov, Johann Kastner

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

7 Citations (Scopus)

Abstract

In an almost inexhaustible multitude of possibilities, CT allows to inspect highly complex systems and materials. Compared to other testing techniques CT provides results in a quick way: It is nondestructive and does not interfere with the specimen, it allows non-touching characterizations and what is most important CT allows to characterize hidden or internal features. However, CT would not have reached its current status in engineering without the achievements and possibilities in data processing. Only through processing, analysis and visualization of CT data, detailed insights into previously unachievable analyses are facilitated. Novel means of data analysis and visualization illustrate highly complex problems by means of clear and easy to understand renderings. In this chapter, we explore various aspects starting from the generalized data analysis pipeline, aspects of processing, analysis and visualization for metrology, nondestructive testing as well as specialized analyses.

Original languageEnglish
Title of host publicationIndustrial X-Ray Computed Tomography
PublisherSpringer International Publishing AG
Pages99-142
Number of pages44
ISBN (Electronic)9783319595733
ISBN (Print)9783319595719
DOIs
Publication statusPublished - 1 Jan 2017

Keywords

  • Visualization
  • Visual Computing
  • Visual Analysis

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