Abstract
We report high resolution (<0.05 cm-1) photoluminescence (PL) spectra of erbium implanted float-zone (FZ) and Czochralski grown (CZ) silicon. We show that the PL spectrum of cubic Er centers observed in CZ-Si annealed at 900°C is the dominant emission in FZ-Si for the same annealing conditions. We assign it to isolated, interstitial erbium. We observe also two other kinds of optically active Er centers with lower than cubic site symmetry: (i) O-related (found only in CZ Si) and (ii) those related to radiation defects. We conclude that coimplantation with light elements does not lead to the formation of Er-codopant complexes, but rather to Er forming complexes with implantation induced lattice defects.
Original language | English |
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Pages (from-to) | 490 |
Number of pages | 1 |
Journal | Applied Physics Letters |
DOIs | |
Publication status | Published - 1995 |
Externally published | Yes |