Abstract
A new signal processing method for wireless interrogation of a passive SAW sensor with multiple reflectors, utilizing the signal interference during overlap of the sensor's response bursts is introduced. Within this time interval, the amplitude or the phase, respectively, is measured. By varying the frequency of the relatively long interrogation bursts, destructive interferences (notches) are searched. So the measurand influencing the sensor or its identification information can be gained. The principle yields high resolution using a low cost interrogating system. The principle, the hardware effort and experimental results for temperature measurements are presented.
| Original language | English |
|---|---|
| Pages (from-to) | 355-358 |
| Number of pages | 4 |
| Journal | Proceedings of the IEEE Ultrasonics Symposium |
| Volume | 1 |
| Publication status | Published - 1997 |
| Event | Ultrasonics Symposium 1997 - Toronto, Canada Duration: 5 Oct 1997 → 8 Oct 1997 |
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