TY - JOUR
T1 - Notch sensors - a new signal processing method for interrogation of passive SAW sensors
AU - Pohl, Alfred
AU - Ostermayer, Gerald
AU - Reindl, Leonhard
AU - Seifert, Franz
N1 - Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1997
Y1 - 1997
N2 - A new signal processing method for wireless interrogation of a passive SAW sensor with multiple reflectors, utilizing the signal interference during overlap of the sensor's response bursts is introduced. Within this time interval, the amplitude or the phase, respectively, is measured. By varying the frequency of the relatively long interrogation bursts, destructive interferences (notches) are searched. So the measurand influencing the sensor or its identification information can be gained. The principle yields high resolution using a low cost interrogating system. The principle, the hardware effort and experimental results for temperature measurements are presented.
AB - A new signal processing method for wireless interrogation of a passive SAW sensor with multiple reflectors, utilizing the signal interference during overlap of the sensor's response bursts is introduced. Within this time interval, the amplitude or the phase, respectively, is measured. By varying the frequency of the relatively long interrogation bursts, destructive interferences (notches) are searched. So the measurand influencing the sensor or its identification information can be gained. The principle yields high resolution using a low cost interrogating system. The principle, the hardware effort and experimental results for temperature measurements are presented.
UR - http://www.scopus.com/inward/record.url?scp=0031364856&partnerID=8YFLogxK
M3 - Conference article
SN - 1051-0117
VL - 1
SP - 355
EP - 358
JO - Proceedings of the IEEE Ultrasonics Symposium
JF - Proceedings of the IEEE Ultrasonics Symposium
T2 - Ultrasonics Symposium 1997
Y2 - 5 October 1997 through 8 October 1997
ER -