Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
E. Jan W. ter Maten, Piotr A. Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J. Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans Georg BrachtendorfKai Bittner, Tomáš Kratochvíl, Jiří Petřzela, Roman Sotner, Tomáš Götthans, Jiří Dřínovský, Sebastian Schöps, David J. Duque Guerra, Thorben Casper, Herbert De Gersem, Ulrich Römer, Pascal Reynier, Patrice Barroul, Denis Masliah, Benoît Rousseau
Research output: Contribution to journal › Article › peer-review
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