Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

E. Jan W. ter Maten, Piotr A. Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J. Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans Georg BrachtendorfKai Bittner, Tomáš Kratochvíl, Jiří Petřzela, Roman Sotner, Tomáš Götthans, Jiří Dřínovský, Sebastian Schöps, David J. Duque Guerra, Thorben Casper, Herbert De Gersem, Ulrich Römer, Pascal Reynier, Patrice Barroul, Denis Masliah, Benoît Rousseau

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

The FP7 project nanoCOPS derives new methods for simulation during development of designs of integrated products. It covers advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It is inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. The project is on-going and the paper presents the outcomes achieved after the first half of the project duration.

Original languageEnglish
Article number2
JournalJournal of Mathematics in Industry
Volume7
Issue number1
DOIs
Publication statusPublished - 1 Dec 2016

Keywords

  • bond wires
  • co-simulation
  • coupled problems
  • fault simulation
  • model order reduction
  • multiphysics
  • multirate
  • power-MOS devices
  • RF-circuitry
  • uncertainty quantification

Fingerprint

Dive into the research topics of 'Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation'. Together they form a unique fingerprint.

Cite this