Abstract
Results from Monte Carlo simulations of two-dimensional projections for a simple real sample (an aluminium cube with a cylindrical hole filled by air or steel) in a realistic experimental environment are presented. A meaningful comparison with measurements was therefore possible. Coherent and incoherent scattering as well as excitation of fluorescent radiation are accounted for; multiple sequences of these interactions are followed up to a selectable order. Such simulations are important aids to modern metrological applications of computed tomography where the dimensional accuracy of hidden or inaccessible components of work pieces is determined. The complex process requires a high level of optimization of the instrumental parameters for each sample type whereby the accurate simulation of the physical interactions between X-rays and the sample material is a supplement and alternative to time consuming measurements.
Original language | English |
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Title of host publication | Denver X-Ray Conference 2007 |
Pages | 150-153 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 2008 |
Event | Denver X-Ray Conference 2007 - Denver, United States Duration: 30 Jul 2007 → 3 Aug 2007 http://www.dxcicdd.com/07/ |
Conference
Conference | Denver X-Ray Conference 2007 |
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Country/Territory | United States |
City | Denver |
Period | 30.07.2007 → 03.08.2007 |
Internet address |
Keywords
- Computed tomography
- Fundamental parameters
- Industrial metrology
- Monte Carlo simulation