Imaging of the microstructure of wheat dough by the complementary rendering of data from x-ray computed tomography and confocal laser scanning microscopy

Katrin Mathmann; Vincent Bürger; Bernhard Fröhler; Christoph Heinzl; Johann Kastner

Imaging of the microstructure of wheat dough by the complementary rendering of data from x-ray computed tomography and confocal laser scanning microscopy

Katrin Mathmann, Vincent Bürger, Bernhard Fröhler, Christoph Heinzl, Johann Kastner

Research Center Wels

Research output: Contribution to conference › Paper

Original language	English
Number of pages	1
Publication status	Published - 2016
Event	30th EFFoST International Conference - Vienna, Austria Duration: 28 Nov 2016 → 30 Nov 2016

Conference

Conference	30th EFFoST International Conference
Country/Territory	Austria
City	Vienna
Period	28.11.2016 → 30.11.2016

Cite this

@conference{b457e2bca6ca4466a83ef3c530d94719,

title = "Imaging of the microstructure of wheat dough by the complementary rendering of data from x-ray computed tomography and confocal laser scanning microscopy",

author = "Katrin Mathmann and Vincent B{\"u}rger and Bernhard Fr{\"o}hler and Christoph Heinzl and Johann Kastner",

year = "2016",

language = "English",

note = "30th EFFoST International Conference ; Conference date: 28-11-2016 Through 30-11-2016",

}

TY - CONF

T1 - Imaging of the microstructure of wheat dough by the complementary rendering of data from x-ray computed tomography and confocal laser scanning microscopy

AU - Mathmann, Katrin

AU - Bürger, Vincent

AU - Fröhler, Bernhard

AU - Heinzl, Christoph

AU - Kastner, Johann

PY - 2016

Y1 - 2016

UR - http://elsevier.conference-services.net/viewsecurePDF.asp?conferenceID=4058&abstractID=938549

M3 - Paper

T2 - 30th EFFoST International Conference

Y2 - 28 November 2016 through 30 November 2016

ER -

Imaging of the microstructure of wheat dough by the complementary rendering of data from x-ray computed tomography and confocal laser scanning microscopy

Conference

Other files and links

Cite this