Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks

Luis F.Alves Pereira, Jan De Beenhouwer, Johann Kastner, Jan Sijbers

Research output: Chapter in Book/Report/Conference proceedingsConference contributionpeer-review

1 Citation (Scopus)

Abstract

X-ray Computed Laminography (CL) is a well-known computed tomography technique to image the internal structure of flat objects. High-quality CL imaging requires, however, a large number of X-ray projections, resulting in long acquisition times. Reducing the number of acquired projections allows to speed up the acquisition process but decreases the quality of the reconstructed images. In this work, we investigate the use of Convolutional Neural Networks for processing volumes reconstructed from only four X-ray projections acquired at an inline CL scanning setup.

Original languageEnglish
Title of host publicationProceedings - IEEE 32nd International Conference on Tools with Artificial Intelligence, ICTAI 2020
EditorsMiltos Alamaniotis, Shimei Pan
PublisherIEEE Computer Society
Pages612-616
Number of pages5
ISBN (Electronic)9781728192284
DOIs
Publication statusPublished - Nov 2020
Event32nd IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2020 - Virtual, Baltimore, United States
Duration: 9 Nov 202011 Nov 2020

Publication series

NameProceedings - International Conference on Tools with Artificial Intelligence, ICTAI
Volume2020-November
ISSN (Print)1082-3409

Conference

Conference32nd IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2020
Country/TerritoryUnited States
CityVirtual, Baltimore
Period09.11.202011.11.2020

Keywords

  • 3D imaging
  • Computed Laminography
  • Convolutional Neural Networks
  • Deep Learning

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