Defect detectability analysis via probability of defect detection between traditional and deep learning methods in numerical simulations

Miroslav Yosifov, Patrick Weinberger, Michael Reiter, Bernhard Fröhler, Jan De Beenhouwer, Jan Sijbers, Johann Kastner, Christoph Heinzl

Research output: Contribution to journalConference article

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Engineering & Materials Science

Chemical Compounds