@inproceedings{b62f48725e0745819fa6500294cca703,
title = "Comparative Analysis of SRAM PUF Temperature Susceptibility on Embedded Systems",
abstract = "An SRAM Physical Unclonable Function (PUF) can distinguish SRAM modules by analyzing the inherent randomness of their start-up behavior. However, the effectiveness of this technique varies depending on the design and fabrication of the SRAM module. This study compares two similar microcontrollers, both equipped with on-chip SRAM, to determine which device produces a better SRAM PUF. Both microcontrollers are programmed with an identical SRAM PUF authentication routine and tested under varying ambient temperatures (ranging from 10 °C to 50 °C) to evaluate the impact of temperature on SRAM PUF performance. One embedded SRAM works significantly better than the other, even though the two models are closely related. The presented results can be used early in the design process to compare arbitrary on-chip SRAM models and see which is best suited for implementing an SRAM PUF.",
keywords = "chip biometrics, embedded systems, fuzzy extractor, hardware authentication, SRAM PUF, temperature",
author = "Martina Zeinzinger and Josef Langer and Florian Eibensteiner and Phillip Petz and Lucas Drack and Daniel Dorfmeister and Rudolf Ramler",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 IEEE International Conference on Electrical, Computer and Energy Technologies, ICECET 2023 ; Conference date: 16-11-2023 Through 17-11-2023",
year = "2023",
doi = "10.1109/ICECET58911.2023.10389242",
language = "English",
series = "International Conference on Electrical, Computer and Energy Technologies, ICECET 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "International Conference on Electrical, Computer and Energy Technologies, ICECET 2023",
address = "United States",
}
