CCD based emissivity measurements for surface characterization in

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection
Number of pages	8
Publication status	Published - 2005
Event	SPIE Optical Metrology 2005 - Munich, Germany Duration: 12 Jun 2005 → 16 Jun 2005

Cite this

@inproceedings{8e1ea590d0c1441f9e78dcee5f76afda,

title = "CCD based emissivity measurements for surface characterization in",

author = "Gerald Zauner and Gerald Darilion and Daniel Heim and G{\"u}nther Hendorfer and Thomas M{\"u}ller",

year = "2005",

language = "English",

booktitle = "Optical Measurement Systems for Industrial Inspection",

note = "SPIE Optical Metrology 2005 ; Conference date: 12-06-2005 Through 16-06-2005",

}

TY - GEN

T1 - CCD based emissivity measurements for surface characterization in

AU - Zauner, Gerald

AU - Darilion, Gerald

AU - Heim, Daniel

AU - Hendorfer, Günther

AU - Müller, Thomas

PY - 2005

Y1 - 2005

M3 - Conference contribution

BT - Optical Measurement Systems for Industrial Inspection

T2 - SPIE Optical Metrology 2005

Y2 - 12 June 2005 through 16 June 2005

ER -