CCD based emissivity measurements for surface characterization in

Gerald Zauner, Gerald Darilion, Daniel Heim, Günther Hendorfer, Thomas Müller

Research output: Chapter in Book/Report/Conference proceedingsConference contribution

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection
Number of pages8
Publication statusPublished - 2005
EventSPIE Optical Metrology 2005 - Munich, Germany
Duration: 12 Jun 200516 Jun 2005

Conference

ConferenceSPIE Optical Metrology 2005
CountryGermany
CityMunich
Period12.06.200516.06.2005

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