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Automated analysis of two-layered feature models with feature attributes
Michael Lettner
, Jorge Rodas
, José A. Galindo
*
, David Benavides
*
Corresponding author for this work
Research Center Hagenberg
Research output
:
Contribution to journal
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Article
›
peer-review
13
Citations (Scopus)
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Keyphrases
Two-layer
100%
Layered Feature
100%
Feature Attribute
100%
Feature Model
100%
Automated Analysis
100%
Multiple Layers
66%
Interdependency
66%
Technological Progress
33%
Application Domain
33%
Knowledge-how
33%
Technical Sustainability
33%
Specific Features
33%
Analysis Application
33%
Software Developers
33%
Variability-intensive Systems
33%
Mobile Application
33%
Equipment Manufacturers
33%
Application Layer
33%
Platform Features
33%
Need to Know
33%
Reference Implementation
33%
Computer Science
Interdependency
100%
Automated Analysis
100%
Application Domain
50%
Application Analysis
50%
Application Layer
50%
Software Developer
50%
Mobile Application
50%
Technological Progress
50%
Reference Implementation
50%
Intensive System
50%