Atomic Force microscopy, A New Supporting Tool in Brain Tumor Diagnosis

Marlene Huml, Gerald Zauner, Rene Silye, Stephan Hutterer, Kurt Schilcher

Research output: Contribution to conferencePaper

Original languageEnglish
Number of pages82
Publication statusPublished - 2011
EventNanoscale 2011 - Santa Barbara, United States
Duration: 19 Jul 201122 Jul 2011


ConferenceNanoscale 2011
Country/TerritoryUnited States
CitySanta Barbara

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