A webcam in Bayer-mode as a light beam profiler for the near infra-red

Gregor Langer; Armin Hochreiner; Peter Burgholzer; Thomas Berer

doi:10.1016/j.optlaseng.2012.12.010

A webcam in Bayer-mode as a light beam profiler for the near infra-red

Gregor Langer, Armin Hochreiner, Peter Burgholzer, Thomas Berer

Research Center Linz

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.

Original language	English
Pages (from-to)	571-575
Number of pages	5
Journal	Optics and Lasers in Engineering
Volume	51
Issue number	5
DOIs	https://doi.org/10.1016/j.optlaseng.2012.12.010
Publication status	Published - May 2013

Keywords

Bayer-mode
Beam profiler
Webcam

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10.1016/j.optlaseng.2012.12.010

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title = "A webcam in Bayer-mode as a light beam profiler for the near infra-red",

abstract = "Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.",

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author = "Gregor Langer and Armin Hochreiner and Peter Burgholzer and Thomas Berer",

note = "Funding Information: This work has been supported by the Christian Doppler Research Association , the Austrian Science Fund (FWF) , Project no. S10503-N20 , the European Regional Development Fund (EFRE) in the framework of the EU-program Regio 13, and the federal state Upper Austria. Copyright: Copyright 2013 Elsevier B.V., All rights reserved.",

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doi = "10.1016/j.optlaseng.2012.12.010",

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AU - Langer, Gregor

AU - Hochreiner, Armin

AU - Burgholzer, Peter

AU - Berer, Thomas

N1 - Funding Information: This work has been supported by the Christian Doppler Research Association , the Austrian Science Fund (FWF) , Project no. S10503-N20 , the European Regional Development Fund (EFRE) in the framework of the EU-program Regio 13, and the federal state Upper Austria. Copyright: Copyright 2013 Elsevier B.V., All rights reserved.

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Y1 - 2013/5

N2 - Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.

AB - Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.

KW - Bayer-mode

KW - Beam profiler

KW - Webcam

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DO - 10.1016/j.optlaseng.2012.12.010

M3 - Article

SN - 0143-8166

VL - 51

SP - 571

EP - 575

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 5

ER -

A webcam in Bayer-mode as a light beam profiler for the near infra-red

Abstract

Keywords

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