A new dispatching rule for optimizing machine utilization at a semiconductor test field

Klaus Altendorfer; Bernhard Kabelka; Wolfgang Stöcher

doi:10.1109/ASMC.2007.375089

A new dispatching rule for optimizing machine utilization at a semiconductor test field

Klaus Altendorfer, Bernhard Kabelka, Wolfgang Stöcher

Research Center Steyr

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

19 Citations (Scopus)

Abstract

This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule "Work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.

Original language	English
Title of host publication	2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC
Publisher	IEEE
Pages	188-193
Number of pages	6
ISBN (Print)	1424406536, 9781424406531
DOIs	https://doi.org/10.1109/ASMC.2007.375089
Publication status	Published - 2007
Event	Advanced Semiconductor Manufacturing Conference 2007 - Stresa, Italy Duration: 11 Jun 2007 → 12 Jun 2007 http://wps2a.semi.org/wps/portal/_pagr/114/_pa.114/273?dFormat=application/msword&docName=P026668

Publication series

Name	ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
ISSN (Print)	1078-8743

Conference

Conference	Advanced Semiconductor Manufacturing Conference 2007
Country/Territory	Italy
City	Stresa
Period	11.06.2007 → 12.06.2007
Internet address	http://wps2a.semi.org/wps/portal/_pagr/114/_pa.114/273?dFormat=application/msword&docName=P026668

Keywords

Dispatching
Scheduling
Production Control
Logistic Characteristic Curves
WIP Reduction

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10.1109/ASMC.2007.375089

Cite this

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title = "A new dispatching rule for optimizing machine utilization at a semiconductor test field",

abstract = "This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule {"}Work in parallel queue{"} (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.",

keywords = "Dispatching, Scheduling, Production Control, Logistic Characteristic Curves, WIP Reduction, Dispatching, Scheduling, Production Control, Logistic Characteristic Curves, WIP Reduction",

author = "Klaus Altendorfer and Bernhard Kabelka and Wolfgang St{\"o}cher",

year = "2007",

doi = "10.1109/ASMC.2007.375089",

language = "English",

isbn = "1424406536",

series = "ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings",

publisher = "IEEE",

pages = "188--193",

booktitle = "2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC",

note = "Advanced Semiconductor Manufacturing Conference 2007 ; Conference date: 11-06-2007 Through 12-06-2007",

url = "http://wps2a.semi.org/wps/portal/_pagr/114/_pa.114/273?dFormat=application/msword&docName=P026668",

}

Altendorfer, K, Kabelka, B & Stöcher, W 2007, A new dispatching rule for optimizing machine utilization at a semiconductor test field. in 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC., 4259255, ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, IEEE, pp. 188-193, Advanced Semiconductor Manufacturing Conference 2007, Stresa, Italy, 11.06.2007. https://doi.org/10.1109/ASMC.2007.375089

A new dispatching rule for optimizing machine utilization at a semiconductor test field. / Altendorfer, Klaus; Kabelka, Bernhard; Stöcher, Wolfgang.
2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC. IEEE, 2007. p. 188-193 4259255 (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings).

Research output: Chapter in Book/Report/Conference proceedings › Conference contribution

TY - GEN

T1 - A new dispatching rule for optimizing machine utilization at a semiconductor test field

AU - Altendorfer, Klaus

AU - Kabelka, Bernhard

AU - Stöcher, Wolfgang

PY - 2007

Y1 - 2007

N2 - This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule "Work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.

AB - This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule "Work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.

KW - Dispatching

KW - Scheduling

KW - Production Control

KW - Logistic Characteristic Curves

KW - WIP Reduction

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KW - Scheduling

KW - Production Control

KW - Logistic Characteristic Curves

KW - WIP Reduction

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M3 - Conference contribution

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T3 - ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings

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BT - 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC

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ER -

A new dispatching rule for optimizing machine utilization at a semiconductor test field

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Keywords

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