A new dispatching rule for optimizing machine utilization at a semiconductor test field

Klaus Altendorfer, Bernhard Kabelka, Wolfgang Stöcher

Research output: Chapter in Book/Report/Conference proceedingsConference contribution

16 Citations (Scopus)

Abstract

This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule "Work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.

Original languageEnglish
Title of host publication2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC
PublisherIEEE
Pages188-193
Number of pages6
ISBN (Print)1424406536, 9781424406531
DOIs
Publication statusPublished - 2007
EventAdvanced Semiconductor Manufacturing Conference 2007 - Stresa, Italy
Duration: 11 Jun 200712 Jun 2007
http://wps2a.semi.org/wps/portal/_pagr/114/_pa.114/273?dFormat=application/msword&docName=P026668

Publication series

NameASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
ISSN (Print)1078-8743

Conference

ConferenceAdvanced Semiconductor Manufacturing Conference 2007
CountryItaly
CityStresa
Period11.06.200712.06.2007
Internet address

Keywords

  • Dispatching
  • Scheduling
  • Production Control
  • Logistic Characteristic Curves
  • WIP Reduction

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