Visual analysis for CT based metrology

  • Christoph Heinzl (Speaker)

Activity: Talk or presentationOral presentation

PeriodJan 2016
Event titleEXTREMA Lorentz workshop: Quantitative 3D X-Ray Imaging: From Tomographic Images to Metrics
Event typeWorkshop
LocationLeiden, NetherlandsShow on map
Degree of RecognitionInternational