TALINT grating kits for X-ray interferometry in the industrial laboratory

Aishwarya Nafre, Jonathan Glinz, Joachim Schulz, Sascha Senck

Publikation: Beitrag in Buch/Bericht/Tagungsband › Konferenzbeitrag

Originalsprache	Deutsch (Österreich)
Titel	11th Conference on Industrial Computed Tomography
Seiten	1-9
Seitenumfang	9
Publikationsstatus	Veröffentlicht - 8 Feb. 2022

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@inproceedings{a818d25327ee48c4a6df22abb3a8a771,

title = "TALINT grating kits for X-ray interferometry in the industrial laboratory",

author = "Aishwarya Nafre and Jonathan Glinz and Joachim Schulz and Sascha Senck",

year = "2022",

month = feb,

day = "8",

language = "Deutsch ({\"O}sterreich)",

pages = "1--9",

booktitle = "11th Conference on Industrial Computed Tomography",

}