Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast

Johann Kastner, Christian Gusenbauer, Sascha Senck, Guruprasad Rao

Publikation: Beitrag in Buch/Bericht/Tagungsband › Konferenzbeitrag

Originalsprache	Englisch
Titel	APCNDT
Publikationsstatus	Veröffentlicht - 2017
Veranstaltung	15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017) - Singapur, Singapur Dauer: 13 Nov. 2017 → 17 Nov. 2017

Konferenz	15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017)
Land/Gebiet	Singapur
Ort	Singapur
Zeitraum	13.11.2017 → 17.11.2017

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@inproceedings{6f1d6fa9ce694e3ba08c9a84f42687b8,

title = "Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast",

author = "Johann Kastner and Christian Gusenbauer and Sascha Senck and Guruprasad Rao",

year = "2017",

language = "English",

booktitle = "APCNDT",

note = "15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017) ; Conference date: 13-11-2017 Through 17-11-2017",

}

TY - GEN

T1 - Talbot-Lau grating interferometer μXCT for quantitative characterization of polymeric structures by using phase and dark field contrast

AU - Kastner, Johann

AU - Gusenbauer, Christian

AU - Senck, Sascha

AU - Rao, Guruprasad

PY - 2017

Y1 - 2017

M3 - Conference contribution

BT - APCNDT

T2 - 15th Asia Pacific Conference for Non-Destructive Testing (APCNDT2017)

Y2 - 13 November 2017 through 17 November 2017

ER -