Simulation of an industrial X-ray cone beam computed-tomography system

Publikation: Beitrag in Buch/Bericht/Tagungsband › Konferenzbeitrag

Originalsprache	Englisch
Titel	Proceedings of IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms - Dresden, Deutschland Dauer: 22 Okt. 2008 → 24 Okt. 2008 http://www.nssmic-xray2008.com/

Workshop	IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms
Land/Gebiet	Deutschland
Ort	Dresden
Zeitraum	22.10.2008 → 24.10.2008
Internetadresse	http://www.nssmic-xray2008.com/

Zitieren

@inproceedings{b80c9cefe37f4a2c9c17b8dff9701848,

title = "Simulation of an industrial X-ray cone beam computed-tomography system",

author = "Michael Reiter and Daniel Weiss and Hubert Lettenbauer and Johann Kastner",

year = "2008",

language = "English",

booktitle = "Proceedings of IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms",

note = "IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms ; Conference date: 22-10-2008 Through 24-10-2008",

url = "http://www.nssmic-xray2008.com/",

}

TY - GEN

T1 - Simulation of an industrial X-ray cone beam computed-tomography system

AU - Reiter, Michael

AU - Weiss, Daniel

AU - Lettenbauer, Hubert

AU - Kastner, Johann

PY - 2008

Y1 - 2008

M3 - Conference contribution

BT - Proceedings of IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms

T2 - IEEE Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms

Y2 - 22 October 2008 through 24 October 2008

ER -