TY - CHAP
T1 - Processing, analysis and visualization of CT data
AU - Heinzl, Christoph
AU - Amirkhanov, Aleksandr
AU - Kastner, Johann
N1 - Publisher Copyright:
© Springer International Publishing AG 2018.
PY - 2017/1/1
Y1 - 2017/1/1
N2 - In an almost inexhaustible multitude of possibilities, CT allows to inspect highly complex systems and materials. Compared to other testing techniques CT provides results in a quick way: It is nondestructive and does not interfere with the specimen, it allows non-touching characterizations and what is most important CT allows to characterize hidden or internal features. However, CT would not have reached its current status in engineering without the achievements and possibilities in data processing. Only through processing, analysis and visualization of CT data, detailed insights into previously unachievable analyses are facilitated. Novel means of data analysis and visualization illustrate highly complex problems by means of clear and easy to understand renderings. In this chapter, we explore various aspects starting from the generalized data analysis pipeline, aspects of processing, analysis and visualization for metrology, nondestructive testing as well as specialized analyses.
AB - In an almost inexhaustible multitude of possibilities, CT allows to inspect highly complex systems and materials. Compared to other testing techniques CT provides results in a quick way: It is nondestructive and does not interfere with the specimen, it allows non-touching characterizations and what is most important CT allows to characterize hidden or internal features. However, CT would not have reached its current status in engineering without the achievements and possibilities in data processing. Only through processing, analysis and visualization of CT data, detailed insights into previously unachievable analyses are facilitated. Novel means of data analysis and visualization illustrate highly complex problems by means of clear and easy to understand renderings. In this chapter, we explore various aspects starting from the generalized data analysis pipeline, aspects of processing, analysis and visualization for metrology, nondestructive testing as well as specialized analyses.
KW - Visualization
KW - Visual Computing
KW - Visual Analysis
UR - http://www.scopus.com/inward/record.url?scp=85042821877&partnerID=8YFLogxK
U2 - 10.1007/978-3-319-59573-3_4
DO - 10.1007/978-3-319-59573-3_4
M3 - Chapter
SN - 9783319595719
SP - 99
EP - 142
BT - Industrial X-Ray Computed Tomography
PB - Springer
ER -