Optical characterization of growing thin films at hight temperatures by analysis of near infrared emissivity variations using CCD thermal imaging

Publikation: Beitrag in Buch/Bericht/TagungsbandKonferenzbeitrag

Abstract

Due to interference effects which occur during the growth of surface thin films, the resulting spectral emissivity varies continuously. It is shown in this paper, that these temporal variations of emissivity allow the determination of the complex index of refraction (i.e. optical constants n, k) of a thin absorbing film, without explicit knowledge of the optical constants of the substrate layer. In particular, this work presents results obtained by the analysis of the thermal radiation of a thin thermally grown iron-oxide film on a heated steel specimen (at approx. 400°C) measured by a standard CCD camera with a near infrared band-pass filter (~1μm).
OriginalspracheEnglisch
TitelProceedings of QIRT 2010
PublikationsstatusVeröffentlicht - 2010
Veranstaltung10th Quantitative Infrared Thermography Conference - Quebec, Kanada
Dauer: 27 Jul 201030 Jul 2010
http://qirt2010.gel.ulaval.ca/

Konferenz

Konferenz10th Quantitative Infrared Thermography Conference
Land/GebietKanada
OrtQuebec
Zeitraum27.07.201030.07.2010
Internetadresse

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