Industrial inspection with open eyes: Advance with machine vision technology

Zheng Liu, Hiroyuki Ukida, Kurt Niel, Pradeep Ramuhalli

Publikation: Beitrag in Buch/Bericht/TagungsbandKapitelBegutachtung

4 Zitate (Scopus)

Abstract

Machine vision systems have evolved significantly with the technology advances to tackle the challenges from modern manufacturing industry. A wide range of industrial inspection applications for quality control are benefiting from visual information captured by different types of cameras variously configured in a machine vision system. This chapter screens the state of the art in machine vision technologies in the light of hardware, software tools, and major algorithm advances for industrial inspection. The inspection beyond visual spectrum offers a significant complementary to the visual inspection. The combination with multiple technologies makes it possible for the inspection to achieve a better performance and efficiency in varied applications. The diversity of the applications demonstrates the great potential of machine vision systems for industry.

OriginalspracheEnglisch
TitelAdvances in Computer Vision and Pattern Recognition
Herausgeber (Verlag)Springer
Seiten1-37
Seitenumfang37
DOIs
PublikationsstatusVeröffentlicht - 2015

Publikationsreihe

NameAdvances in Computer Vision and Pattern Recognition
Band48
ISSN (Print)2191-6586
ISSN (elektronisch)2191-6594

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