Abstract
Recent studies have shown that the T 2 control chart with variable sampling intervals (VSI) and/or variable sample sizes (VSS) detects process shifts faster than the traditional T 2 chart. This article extends these studies for processes that are monitored with VSI and VSS using double warning lines (T 2 -DWL). It is assumed that the length of time the process remains in control has exponential distribution. The properties of T 2 -DWL chart are obtained using Markov chains. The results show that the T 2 -DWL chart is quicker than VSI and/or VSS charts in detecting almost all shifts in the process mean.
Originalsprache | Englisch |
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Seiten (von - bis) | 569-593 |
Seitenumfang | 25 |
Fachzeitschrift | Statistical Papers |
Jahrgang | 47 |
Ausgabenummer | 4 |
DOIs | |
Publikationsstatus | Veröffentlicht - Okt. 2006 |