Factor-space dimension reduction for sensitivity analysis of intelligent electronic devices

Keyphrases

• Sensitivity Analysis 100%
• Dimensionality Reduction 100%
• Intelligent Electronic Device 100%
• Factor Space 100%
• Measurement Accuracy 60%
• Measurement Algorithm 40%
• Uncertainty Analysis 40%
• Step Change 40%
• Number of Factors 20%
• Transmission Line 20%
• Monte Carlo Simulation 20%
• High Dimension 20%
• Proposed Methodology 20%
• Screening Method 20%
• Input Factors 20%
• Number of Tests 20%
• Performance Index 20%
• Systematic Uncertainty 20%
• Device Testing 20%
• Cosine Filter 20%
• Steady-state Error 20%
• Factor Screening 20%
• Screening Algorithm 20%
• Model Deviation 20%
• Injection Test 20%
• Transient Conditions 20%
• Factor Value 20%

Engineering

• Space Dimension 100%
• Step Change 100%
• Electric Lines 50%
• Transients 50%
• Main Reason 50%
• Dimensional Factor 50%
• Steady State Error 50%