Comparative Analysis of SRAM PUF Temperature Susceptibility on Embedded Systems

Martina Zeinzinger; Josef Langer; Florian Eibensteiner; Phillip Michael Christian Fred Petz; Lucas Drack; Daniel Dorfmeister; Rudolf Ramler

Comparative Analysis of SRAM PUF Temperature Susceptibility on Embedded Systems

Martina Zeinzinger, Josef Langer, Florian Eibensteiner, Phillip Michael Christian Fred Petz, Lucas Drack, Daniel Dorfmeister, Rudolf Ramler

Publikation: Konferenzbeitrag › Papier › Begutachtung

Originalsprache	Englisch
Publikationsstatus	Angenommen/Im Druck - 11 Sep. 2023
Veranstaltung	International Conference on Electrical, Computer and Energy Technologies - South Africa, Cape Town, Südafrika Dauer: 16 Nov. 2023 → 17 Nov. 2023 http://www.icecet.com/

Konferenz

Konferenz	International Conference on Electrical, Computer and Energy Technologies
Kurztitel	ICECET
Land/Gebiet	Südafrika
Ort	Cape Town
Zeitraum	16.11.2023 → 17.11.2023
Internetadresse	http://www.icecet.com/

Zitieren

@conference{fb2432f810734e5da35f68334c46ae39,

title = "Comparative Analysis of SRAM PUF Temperature Susceptibility on Embedded Systems",

keywords = "SRAM PUF, embedded systems, hardware authentication, fuzzy extractor, chip biometrics, temperature",

author = "Martina Zeinzinger and Josef Langer and Florian Eibensteiner and Petz, {Phillip Michael Christian Fred} and Lucas Drack and Daniel Dorfmeister and Rudolf Ramler",

year = "2023",

month = sep,

day = "11",

language = "English",

note = "International Conference on Electrical, Computer and Energy Technologies, ICECET ; Conference date: 16-11-2023 Through 17-11-2023",

url = "http://www.icecet.com/",

}

TY - CONF

T1 - Comparative Analysis of SRAM PUF Temperature Susceptibility on Embedded Systems

AU - Zeinzinger, Martina

AU - Langer, Josef

AU - Eibensteiner, Florian

AU - Petz, Phillip Michael Christian Fred

AU - Drack, Lucas

AU - Dorfmeister, Daniel

AU - Ramler, Rudolf

PY - 2023/9/11

Y1 - 2023/9/11

KW - SRAM PUF

KW - embedded systems

KW - hardware authentication

KW - fuzzy extractor

KW - chip biometrics

KW - temperature

M3 - Paper

T2 - International Conference on Electrical, Computer and Energy Technologies

Y2 - 16 November 2023 through 17 November 2023

ER -