CCD based emissivity measurements for surface characterization in

Publikation: Beitrag in Buch/Bericht/Tagungsband › Konferenzbeitrag

Originalsprache	Englisch
Titel	Optical Measurement Systems for Industrial Inspection
Seitenumfang	8
Publikationsstatus	Veröffentlicht - 2005
Veranstaltung	SPIE Optical Metrology 2005 - Munich, Deutschland Dauer: 12 Juni 2005 → 16 Juni 2005

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@inproceedings{8e1ea590d0c1441f9e78dcee5f76afda,

title = "CCD based emissivity measurements for surface characterization in",

author = "Gerald Zauner and Gerald Darilion and Daniel Heim and G{\"u}nther Hendorfer and Thomas M{\"u}ller",

year = "2005",

language = "English",

booktitle = "Optical Measurement Systems for Industrial Inspection",

note = "SPIE Optical Metrology 2005 ; Conference date: 12-06-2005 Through 16-06-2005",

}

TY - GEN

T1 - CCD based emissivity measurements for surface characterization in

AU - Zauner, Gerald

AU - Darilion, Gerald

AU - Heim, Daniel

AU - Hendorfer, Günther

AU - Müller, Thomas

PY - 2005

Y1 - 2005

M3 - Conference contribution

BT - Optical Measurement Systems for Industrial Inspection

T2 - SPIE Optical Metrology 2005

Y2 - 12 June 2005 through 16 June 2005

ER -