A webcam in Bayer-mode as a light beam profiler for the near infra-red

Gregor Langer, Armin Hochreiner, Peter Burgholzer, Thomas Berer

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

17 Zitate (Scopus)

Abstract

Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.

OriginalspracheEnglisch
Seiten (von - bis)571-575
Seitenumfang5
FachzeitschriftOptics and Lasers in Engineering
Jahrgang51
Ausgabenummer5
DOIs
PublikationsstatusVeröffentlicht - Mai 2013

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