A new dispatching rule for optimizing machine utilization at a semiconductor test field

Klaus Altendorfer, Bernhard Kabelka, Wolfgang Stöcher

Publikation: Beitrag in Buch/Bericht/TagungsbandKonferenzbeitrag

19 Zitate (Scopus)

Abstract

This paper presents a new dispatching rule for multi-product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (Work In Process). It shows the relative advantage of the newly developed dispatching rule "Work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.

OriginalspracheEnglisch
Titel2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC
Herausgeber (Verlag)IEEE
Seiten188-193
Seitenumfang6
ISBN (Print)1424406536, 9781424406531
DOIs
PublikationsstatusVeröffentlicht - 2007
VeranstaltungAdvanced Semiconductor Manufacturing Conference 2007 - Stresa, Italien
Dauer: 11 Juni 200712 Juni 2007
http://wps2a.semi.org/wps/portal/_pagr/114/_pa.114/273?dFormat=application/msword&docName=P026668

Publikationsreihe

NameASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
ISSN (Print)1078-8743

Konferenz

KonferenzAdvanced Semiconductor Manufacturing Conference 2007
Land/GebietItalien
OrtStresa
Zeitraum11.06.200712.06.2007
Internetadresse

Schlagwörter

  • Dispatching
  • Scheduling
  • Production Control
  • Logistic Characteristic Curves
  • WIP Reduction

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