The presented work describes a novel method for
statistical analysis of multi-material-components.
The application scenario is industrial 3D Xray
computed tomography (3DCT), emphasizing
metrology of artefact affected plastics-metal components,
which feature high differences in attenuation.
The presented work makes use of dual energy
CT data acquisition for artefact reduction purposes
and for optimizing scans of multi-materialcomponents.
Using statistical analysis, information
on uncertainty is introduced, which allows a detailed
characterization of single materials as well as
material interfaces.
The major contribution of this paper is the development
of a specific pipeline, which is based on the
dual exposure technique of dual energy CT. After
the multi-scan fusion step, the statistical analysis is
carried out by computing probability volumes using
a local histogram analysis technique. The application
areas as well as the achieved precision of the
presented method are depicted using a test specimen
and a real world component.
Zeitraum
8 Okt. 2008
Ereignistitel
13th International Fall Workshop on Vision, Modelling, and Visualization 2008